Characterization of amorphous silicon and silicon nanoparticle films using variable angle spectroscopic ellipsometry

Valentine, ClareKlafehn, GrantAiruoyo, IdemudiaKendrick, ChitoFurtak, Thomas E.Collins, Reuben T.2017-07-312022-02-032017-07-312022-02-03https://hdl.handle.net/11124/171253http://dx.doi.org/10.25676/11124/171253postersengCopyright of the original work is retained by the author.Characterization of amorphous silicon and silicon nanoparticle films using variable angle spectroscopic ellipsometryText