Williamson, Don L.Chen, Yan2023-07-112023-07-111994http://hdl.handle.net/11124/177268Includes bibliographical references (pages 111-116).doctoral dissertationsengCopyright of the original work is retained by the author.MicrostructureAmorphous semiconductorsSiliconThin filmsX-rays ScatteringMicrostructure study of amorphous silicon-based semiconductors by small-angle x-ray scatteringText