Characterization of nanostructures using optical second- and third-harmonic generation microscopy

Squier, Jeff A.Chandler, Eric V.2023-01-122023-01-122007https://hdl.handle.net/11124/15945Includes bibliographical references (pages 52-54).masters thesesengCopyright of the original work is retained by the author.Nanostructures -- Optical propertiesOptoelectronics -- MaterialsHarmonic analysisLaser pulses, UltrashortNanostructured materials -- Optical propertiesCharacterization of nanostructures using optical second- and third-harmonic generation microscopyText