Williamson, Don L.Ahrenkiel, Richard K.Johnston, Steven Wade2023-07-242023-07-241999https://hdl.handle.net/11124/177454Includes bibliographical references (pages 101-108).doctoral dissertationsengCopyright of the original work is retained by the author.Semiconductors -- TestingTemperature-dependent, minority-carrier lifetime by ultrahigh-frequency photoconductive decayText