Origin of electrical property deterioration with increasing magnesium concentration in gallium doped zinc magnesium oxide, The

O'Hayre, Ryan P.Ginley, D. S. (David S.)Ke, Yi2023-02-012023-02-012011https://hdl.handle.net/11124/16293Includes bibliographical references (leaves 46-50).masters thesesengCopyright of the original work is retained by the author.Doped semiconductorsGallium -- ElectrometallurgyMagnesium oxidePulsed laser depositionThin filmsOrigin of electrical property deterioration with increasing magnesium concentration in gallium doped zinc magnesium oxide, TheText