Squier, Jeff A.Durfee, Charles G.Chandler, Eric V.2023-08-302023-08-302012https://hdl.handle.net/11124/177908Includes bibliographical references (pages 169-184).doctoral dissertationsengCopyright of the original work is retained by the author.Multiphoton excitation microscopyNanostructured materialsFluorescence microscopyImage processing -- MethodsMultiphoton microscopy techniques for exploring the role of defect states in the emission characteristics of silicon nanoparticlesText