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dc.contributor.advisorSquier, Jeff A.
dc.contributor.advisorDurfee, Charles G.
dc.contributor.authorChandler, Eric V.
dc.date.accessioned2023-08-30T20:11:13Z
dc.date.available2023-08-30T20:11:13Z
dc.date.issued2012
dc.identifierT 7061
dc.identifier.urihttp://hdl.handle.net/11124/177908
dc.descriptionIncludes bibliographical references (pages 169-184).
dc.format.mediumdoctoral dissertations
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof2012 - Mines Theses & Dissertations
dc.rightsCopyright of the original work is retained by the author.
dc.subject.lcshMultiphoton excitation microscopy
dc.subject.lcshNanostructured materials
dc.subject.lcshFluorescence microscopy
dc.subject.lcshImage processing -- Methods
dc.titleMultiphoton microscopy techniques for exploring the role of defect states in the emission characteristics of silicon nanoparticles
dc.typeText
thesis.degree.nameDoctor of Philosophy (Ph.D.)
thesis.degree.levelDoctoral
thesis.degree.disciplinePhysics
thesis.degree.grantorColorado School of Mines


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