Show simple item record

dc.contributor.advisorSquier, Jeff A.
dc.contributor.advisorDurfee, Charles G.
dc.contributor.authorChandler, Eric V.
dc.date.accessioned2023-08-30T20:11:13Z
dc.date.available2023-08-30T20:11:13Z
dc.date.issued2012
dc.identifierT 7061
dc.identifier.urihttps://hdl.handle.net/11124/177908
dc.descriptionIncludes bibliographical references (pages 169-184).
dc.format.mediumdoctoral dissertations
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof2010-2019 - Mines Theses & Dissertations
dc.rightsCopyright of the original work is retained by the author.
dc.subject.lcshMultiphoton excitation microscopy
dc.subject.lcshNanostructured materials
dc.subject.lcshFluorescence microscopy
dc.subject.lcshImage processing -- Methods
dc.titleMultiphoton microscopy techniques for exploring the role of defect states in the emission characteristics of silicon nanoparticles
dc.typeText
thesis.degree.nameDoctor of Philosophy (Ph.D.)
thesis.degree.levelDoctoral
thesis.degree.disciplinePhysics
thesis.degree.grantorColorado School of Mines


Files in this item

Thumbnail
Name:
Chandler_10797411.pdf
Size:
108.3Mb
Format:
PDF

This item appears in the following Collection(s)

Show simple item record