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dc.contributor.advisorFurtak, Thomas E. (Thomas Elton), 1949-
dc.contributor.authorVerley, Jason C.
dc.date.accessioned2023-07-24T20:46:28Z
dc.date.available2023-07-24T20:46:28Z
dc.date.issued2000
dc.identifierT 5371
dc.identifier.urihttp://hdl.handle.net/11124/177512
dc.descriptionIncludes bibliographical references (pages 87-91).
dc.format.mediumdoctoral dissertations
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof2000-2009 - Mines Theses & Dissertations
dc.rightsCopyright of the original work is retained by the author.
dc.subject.lcshEllipsometry
dc.subject.lcshEllipsometry -- Equipment and supplies
dc.subject.lcshEllipsometry -- Equipment and supplies -- Design and construction
dc.subject.lcshThin films -- Optical properties
dc.titleDevelopment of a new type of ellipsometer and an ellipsometric investigation of Cu(In,Ga)Se₂ thin films, The
dc.typeText
thesis.degree.nameDoctor of Philosophy (Ph.D.)
thesis.degree.levelDoctoral
thesis.degree.disciplinePhysics
thesis.degree.grantorColorado School of Mines


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