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dc.contributor.advisorWilliamson, Don L.
dc.contributor.authorChen, Yan
dc.date.accessioned2023-07-11T19:44:41Z
dc.date.available2023-07-11T19:44:41Z
dc.date.issued1994
dc.identifierT 4492
dc.identifier.urihttp://hdl.handle.net/11124/177268
dc.descriptionIncludes bibliographical references (pages 111-116).
dc.format.mediumdoctoral dissertations
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof1990-1999 - Mines Theses & Dissertations
dc.rightsCopyright of the original work is retained by the author.
dc.subject.lcshMicrostructure
dc.subject.lcshAmorphous semiconductors
dc.subject.lcshSilicon
dc.subject.lcshThin films
dc.subject.lcshX-rays Scattering
dc.titleMicrostructure study of amorphous silicon-based semiconductors by small-angle x-ray scattering
dc.typeText
thesis.degree.nameDoctor of Philosophy (Ph.D.)
thesis.degree.levelDoctoral
thesis.degree.disciplinePhysics
thesis.degree.grantorColorado School of Mines


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