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dc.contributor.advisorAhrenkiel, Richard K.
dc.contributor.authorCreek, Edith
dc.date.accessioned2021-03-03T21:58:02Z
dc.date.accessioned2022-02-03T10:54:21Z
dc.date.available2021-03-03T21:58:02Z
dc.date.available2022-02-03T10:54:21Z
dc.date.issued1992
dc.identifierT 4116
dc.identifier.urihttps://hdl.handle.net/11124/176217
dc.descriptionIncludes bibliographical references.
dc.format.mediummasters theses
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof1990-1999 - Mines Theses & Dissertations
dc.rightsCopyright of the original work is retained by the author.
dc.subject.lcshHall effect
dc.subject.lcshSemiconductors
dc.titleAC Hall measurement system for HgCdTe, An
dc.typeText
thesis.degree.nameMaster of Science (M.S.)
thesis.degree.levelMasters
thesis.degree.disciplinePhysics
thesis.degree.grantorColorado School of Mines


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