Show simple item record

dc.contributor.advisorAgarwal, Sumit
dc.contributor.authorGasvoda, Ryan J.
dc.contributor.authorLeick, Noemi
dc.contributor.authorvan de Steeg, Alex
dc.contributor.authorOvanesyan, Rafiel A.
dc.contributor.authorKlein, Jeffrey M.
dc.contributor.authorBhowmich, Ranadeep
dc.contributor.authorHudson, Eric A.
dc.contributor.authorAgarwal, Sumit
dc.date2017
dc.date.accessioned2017-05-01T22:20:31Z
dc.date.accessioned2022-02-03T10:22:10Z
dc.date.available2017-05-01T22:20:31Z
dc.date.available2022-02-03T10:22:10Z
dc.identifier.urihttps://hdl.handle.net/11124/170894
dc.identifier.urihttp://dx.doi.org/10.25676/11124/170894
dc.format.mediumposters
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof2017 Graduate Research And Discovery Symposium (GRADS) posters and presentations
dc.rightsCopyright of the original work is retained by the author.
dc.titleIn situ optical diagnostic study of the atomic layer etching of SiO2, An
dc.typeStillImage
thesis.degree.disciplineChemical and Biological Engineering


Files in this item

Thumbnail
Name:
Gasvoda_Poster.pdf
Size:
1.213Mb
Format:
PDF

This item appears in the following Collection(s)

Show simple item record