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dc.contributor.advisorOhno, Timothy R.
dc.contributor.authorMurrell, David A.
dc.date.accessioned2023-03-21T21:37:01Z
dc.date.available2023-03-21T21:37:01Z
dc.date.issued2009
dc.identifierT 6585
dc.identifier.urihttp://hdl.handle.net/11124/16803
dc.descriptionIncludes bibliographical references (page 61).
dc.format.mediummasters theses
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado School of Mines. Arthur Lakes Library
dc.relation.ispartof2000-2009 - Mines Theses & Dissertations
dc.rightsCopyright of the original work is retained by the author.
dc.subject.lcshThin films Defects
dc.subject.lcshCadmium telluride
dc.subject.lcshSolar cells -- Materials -- Defects
dc.titleBias dependent measurements of deep electronic states in thin CDTE solar cells
dc.typeText
thesis.degree.nameMaster of Science (M.S.)
thesis.degree.levelMasters
thesis.degree.disciplinePhysics
thesis.degree.grantorColorado School of Mines


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