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Characterization of amorphous silicon and silicon nanoparticle films using variable angle spectroscopic ellipsometry
Valentine, Clare Klafehn, Grant Airuoyo, Idemudia Kendrick, Chito Furtak, Thomas E. Collins, Reuben T.
Valentine, Clare
Klafehn, Grant
Airuoyo, Idemudia
Kendrick, Chito
Furtak, Thomas E.
Collins, Reuben T.
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2014-08
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