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Bias dependent measurements of deep electronic states in thin CDTE solar cells

Murrell, David A.
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Advisor
Ohno, Timothy R.
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Date
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2009
Date Submitted
Keywords
Thin films Defects
 Cadmium telluride
 Solar cells -- Materials -- Defects
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2000-2009 - Mines Theses & Dissertations
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Murrell_10795785.pdf
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Murrell_10795785supplemental.zip
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https://hdl.handle.net/11124/16803
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Copyright of the original work is retained by the author.
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