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Temperature-dependent, minority-carrier lifetime by ultrahigh-frequency photoconductive decay

Johnston, Steven Wade
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Williamson, Don L.
Ahrenkiel, Richard K.
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Date
Date Issued
1999
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Keywords
Semiconductors -- Testing
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1990-1999 - Mines Theses & Dissertations
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Johnston_10796787.pdf
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https://hdl.handle.net/11124/177454
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Copyright of the original work is retained by the author.
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