Loading...
Optical microstructural characterization of highly deformed and etch resistant materials
Hawkins, C. J. Lowe, Terry C.
Hawkins, C. J.
Lowe, Terry C.
Citations
Altmetric:
Advisor
Editor
Date
2023-04
Date Issued
Date Submitted
Keywords
Collections
Research Projects
Organizational Units
Journal Issue
Embargo Expires
Abstract
In academia [sic] settings access to advanced characterization methods are often readily available and used without a second thought. While these methods are beneficial to all, their limited availability can be problematic for others trying to reproduce or develop discoveries made in research without access to the same characterization methods. To support collaborators in developing new materials our team has been researching alternatives to advanced characterization methods using more readily available digital optical microscopes. This project specifically focuses on using chemical etching and optical microscopy to reveal the microstructure of highly deformed Inconel 625 wires to evaluate their potential uses for a wide range of neurovascular devices and other medical applications.
Associated Publications
Rights
Copyright of the original work is retained by the author.