Loading...
Numerical modeling of vapor behavior in effusion sources used in thin-film deposition processes
Pavol, Mark J.
Pavol, Mark J.
Citations
Altmetric:
Advisor
Editor
Date
Date Issued
2002
Date Submitted
Collections
Research Projects
Organizational Units
Journal Issue
Embargo Expires
Abstract
Associated Publications
Rights
Copyright of the original work is retained by the author.