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Modeling self-heating and negative bias temperature instability in FinFETs

Sommer, David E.
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Advisor
Carr, Lincoln D.
Graas, Carole D.
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Date
Date Issued
2012
Date Submitted
2012
Keywords
Metal oxide semiconductor field-effect transistors -- Design and construction
 Materials at high temperatures
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2010-2019 - Mines Theses & Dissertations
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T7034.pdf
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https://hdl.handle.net/11124/171925
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Copyright of the original work is retained by the author.
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