Thumbnail Image
Publication

Development of a new type of ellipsometer and an ellipsometric investigation of Cu(In,Ga)Se₂ thin films, The

Verley, Jason C.
Citations
Altmetric:
Advisor
Furtak, Thomas E. (Thomas Elton), 1949-
Editor
Date
Date Issued
2000
Date Submitted
Keywords
Ellipsometry
 Ellipsometry -- Equipment and supplies
 Ellipsometry -- Equipment and supplies -- Design and construction
 Thin films -- Optical properties
Collections
2000-2009 - Mines Theses & Dissertations
Show all metadata
Files
Thumbnail Image
Verley_10796850.pdf
Adobe PDF, 25.73 MB
Research Projects
Organizational Units
Journal Issue
URI
https://hdl.handle.net/11124/177512
Embargo Expires
Abstract
Associated Publications
Rights
Copyright of the original work is retained by the author.
Embedded videos