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Improving electron beam induced current analysis of CdTe devices through principal component analysis

Jones, Sean Michael
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Gorman, Brian P.
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2023
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2023 - Mines Theses & Dissertations
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https://hdl.handle.net/11124/178642
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Abstract
The development of modern photovoltaic devices requires the ability to correlate uncontrolled micro-structure growth with changes in the electronic properties of the device. While Electron Beam Induced Current (EBIC) characterization should be well positioned to lead this analysis, its interpretation has proven difficult in thin film devices. In this document, we present improvements to two methods reducing interpretation ambiguity in EBIC analysis. First we demonstrate voltage-biased EBIC on a low short-circuit current device. Device choice allowed us to obtain high resolution voltage dependent collection maps. We combine these collection maps with simulation and principal component analysis to experimentally demonstrate low correlation between short circuit collection and voltage response as well as a method for identifying regions with similar voltage responses. Next we demonstrate variable beam-current injection dependent EBIC. We expanded on the single study that had previously demonstrated this technique, combining it with principal component analysis. From this we developed the ability to differentiate regions of similar collection efficiency so as to identify barriers to collection. This dissertation serves to demonstrate how much additional information can be obtained through the variation of imaging conditions. Through the combination of variable imaging conditions and principal component analysis, we are able to decrease characterization ambiguity with no additional investment for the tool owner. We are able to two forms of lateral grain boundaries in CdTe devices. These techniques are able to definitively show the role grain boundaries play in short circuit collection efficiencies.
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