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Sample preparation technique development for atom probe tomography of nanoparticles

Johnson, Kayla
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Advisor
Gorman, Brian P.
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Date
Date Issued
2017
Date Submitted
Keywords
electrophoresis
 nanoparticles
 atom probe tomography
 zirconia
 electrophoretic deposition
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2010-2019 - Mines Theses & Dissertations
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Johnson_mines_0052N_11409.pdf
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https://hdl.handle.net/11124/172036
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Abstract
Atom Probe Tomography (APT) can produce 3D chemical analysis on the atomic scale and there is an increasing interest for the analysis of nanoparticles (NPs). In the past there has been limited success with special geometry and non-bulk nanomaterials. In this work several APT sample preparation techniques were trialed on zirconia NPs. The main characterizations were performed using scanning electron microscopy (SEM) and Focused Ion Beam (FIB). Electrophoresis and dispersions were trialed for parameter optimizations. The decrease in electrophoretic deposition time and voltage decreased the density of NPs and agglomerates deposited on to pre-sharpened APT tips.
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